Event
Beginning: 06/26/24
Location: Online
Hosted by Compound Semiconductor Magazine
Wednesday, June 26, 2024 at 2:00 p.m EDT
There are many factors that affect wafer yield such as uniformity and defectivity amongst others. Currently optical spectroscopies such as Raman and Photoluminescence are some of the techniques of choice in assessing these wafer performance parameters.
In this webinar, we show the relevance of applying spectroscopic tools such Raman, Photoluminescence, Time-Resolved Photoluminescence and Cathodoluminescence in characterizing key wafer performance parameters for wide bandgap materials. We also address some of the unique challenges in doing these measurements for wide bandgap semiconductors and how to overcome them.There are many factors that affect wafer yield such as uniformity and defectivity amongst others. Currently optical spectroscopies such as Raman and Photoluminescence are some of the techniques of choice in assessing these wafer performance parameters.
