X-Ray Fluorescence Analyzer

MESA-50K

In order to meet RoHS/ELV and to analyze hazardous elements, HORIBA has offered the X-ray Fluorescence Analyzer XGT-1000WR series. Since 2002, 1000 units have been used all over the world for these applications to meet the critical needs from our customers to analyze the sample without cutting it. In 2012, an intuitive MESA-50 X-ray Fluorescence Analyser was released. It became every popular in a very short amount of time, and in 2013 a new type of MESA-50 with a big sample chamber has been added to the MESA-50 series.  It is equipped with the sophisticated LN2-free detector.  As/Sb analysis function and Multilayer Film FPM are available as options.

Segment: Scientific
Division: Elemental Analysis
Base product
Manufacturing Company: HORIBA Ltd.

1. Speedy

  • Silicon Drift Detector (SDD) drastically reduces measurement times, and provides increased sensitivity, for true high throughput analysis.

2. Small

  • The MESA-50K features a large sized chamber without compromising the minimum footprint. Can be simply connected to PC via USB.

3. Simple

  • Reduce routine maintenance work (LN2 free operation)
  • No need for vacuum pumps
  • Intuitive simple measurement process for all material types

4. Smart

  • English / Japanese / Chinese user interfaces
  • Excel® data management tool

5. Safe

  • No worry about X-ray leakage

Options & Consumables

 

Basic Items

 
PrincipleEnergy dispersive X-ray fluorescence spectrometry
Target applicationRoHS, ELV, Halogen Free
Meas. Elements13Al - 92U
Sample typeSolid, Liquid, Powder
X-ray generator

 
X-ray tubeMax 50kV, 0.2mA
X-ray irradiation size1.2mm, 3mm, 7mm (Automatic switching)
X-ray primary filter4 types (Automatic switching) 
Detector
 
TypeSDD (Silicon Drift Detector)
Signal processorDigital pulse processor
Sample chamberAtmosphereAir
Sample observationCCD camera
Chamber size460 x 360 x 150 mm [W x D x H]
UtilityOperationPC (Windows® 7)
Power supply100-240V, 50/60Hz
Dimensions 590 x 590 x 400 mm [W x D x H]
Weight 60 kg
SoftwareAnalysis FunctionMultilayer Film FPM (Optional), Sb/As analysis (Optional)

*Windows is a registered trademark of Microsoft Corporation.

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Wear metals and additive Elements Analysis.
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MESA-50 catalog
CategoryDocuments
Size 0.71 MB
FiletypePDF

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