Characterization of photovoltaic devices

by Spectroscopic Ellipsometry

This application illustrates the ability of the technique to characteriza photovolatic devices. The materials commonly studied include: amorphous silicon, poly silicon, ZnO, ITO, SNO2, TiO2, SiNx, MgO, etc...

Characterization of photovoltaic devices
DescriptionA photovoltaic cell, or solar cell is a semiconductor device consisting of large-area p-n junction diode that in the presence of sunlight is capable of generating usable electrical energy.This conversion is called the photovoltaic effect.
Size 0.29 MB
FiletypePDF

Related Products

Spectroscopic Ellipsometer - UVISEL Plus
MoreSpectroscopic Ellipsometer - UVISEL Plus
FUV to NIR: 190 to 2100 nm

REQUEST FOR INFORMATION

Do you have any questions or requests? Use this form to contact our specialists.